首页> 外文会议>IEEE Electrical Design of Advanced Packaging Systems Symposium >Design and characterization of magnetically coupled on-chip current probe for monitoring switching current in chip I/O PDN
【24h】

Design and characterization of magnetically coupled on-chip current probe for monitoring switching current in chip I/O PDN

机译:磁耦合片电流探头的设计与表征,用于监控芯片I / O PDN的开关电流

获取原文

摘要

In this paper, we present an on-chip embedded current probe that uses magnetic field coupling mechanism to determine on-chip switching current waveform especially in chip I/O power distribution network (PDN).
机译:在本文中,我们介绍了一种片上嵌入式电流探头,该电流探头使用磁场耦合机制来确定片上切换电流波形,尤其是芯片I / O配电网络(PDN)。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号