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Chip-package-PCB co-design: Dealing with harmonic desensitization in RF SoC/SiP

机译:芯片包 - PCB共同设计:在RF SOC / SIP中处理谐波脱敏

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A comprehensive study based on chip-package-PCB co-design is presented to deal with the harmonic desensitization issue in RF receivers. To gain insights on the interaction between the chip, interconnects, and harmonic interferences, simplified interconnect models were co-simulated with the crystal oscillator as well as the posterior buffer chain to realize the mutual dependency. It was found that decoupling mechanism and interconnect parasitics will dominate the harmonic leakage from the crystal oscillator chain. By optimizing the decoupling and interconnect parasitics, the desensitization phenomenon can be eliminated completely. This generalized analysis can widely be applied to all kinds of system-on-chip (SoC) / system-in-package (SiP) designs for wireless communication applications, in which interferences and couplings are critical bottlenecks of system integrations.
机译:提出了一种基于芯片包 - PCB共同设计的综合研究,以处理RF接收器中的谐波脱敏问题。 为了获得芯片,互连和谐波干扰之间的相互作用的见解,用晶体振荡器以及后缓冲链共同模拟简化的互连模型,以实现相互依赖性。 发现去耦机制和互连寄生剂将占据晶体振荡链链的谐波泄漏。 通过优化去耦和互连寄生菌,可以完全消除脱敏现象。 该广义分析广泛应用于用于无线通信应用的各种片上(SOC)/系统内容(SIP)设计,其中干扰和耦合是系统集成的关键瓶颈。

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