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Properties of Organic-Inorganic Hybrid Thin Film Transistorswith ZnO Active Layer on PES Substrates

机译:PES基材上有机 - 无机杂交薄膜晶体管的性质

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The flexible organic-inorganic thin film transistors (OITFTs) were fabricated with the structure of Al/ZnO/PVP/A1 on PES (polyether sulfone) flexible substrate. PVP [poly-4-vinylphenol] organic gate insulator was coated on Al/PES film by the spin coating method. ZnO active channel layer was deposited on PVP/Si substrate by using atomic layer deposition (ALD) at various temperatures from 80 -140 °C. The structural and electrical properties of ZnO films were analyzed by X-ray diffraction (XRD) and hall-effect measurement system. The carrier concentration and resistivity of ZnO film deposited at 100 °C were found to be about 10~(17) and 37.7 m, respectively. The field effect mobility () and threshold voltage (V_(TH)) of the prepared OITFT were about 0.01 cm~2/V and 12 V, respectively. The I_(on/off)switching ratio was about 10~4.
机译:柔性有机 - 无机薄膜晶体管(OITFTs)用Al / ZnO / PVP / A1的结构对PES(聚醚砜)柔性基材的结构制备。通过旋涂法涂覆在Al / PES膜上的PVP [聚-4-乙烯基蛋白]有机栅极绝缘体。通过使用80 -140℃的各种温度,通过使用原子层沉积(ALD)在PVP / Si衬底上沉积ZnO有源通道层。通过X射线衍射(XRD)和霍尔效应测量系统分析ZnO膜的结构和电性能。发现沉积在100℃下的ZnO膜的载体浓度和电阻率分别为约10〜(17)和37.7μm。制备的OITFT的场效期迁移率()和阈值电压(V_(v_(v_(v_(v_))分别为约0.01cm〜2 / v和12V。 I_(ON / OFF)切换比率约为10〜4。

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