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Investigation of impurity composition of atomic hydrogen beam formed by a low-pressure arc-discharge source

机译:低压电弧源形成的原子氢束杂质组成的研究

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Results of impurity composition investigation of large-area atomic hydrogen beam formed by a low-pressure arc discharge source with self-heated cathode were cited. The study was performed on 18 metallic elements. Method, based on measurement of sheet concentration of metal atoms on Si sample surface before and after exposition in atomic hydrogen flow was used for determination of composition of impurities in atomic hydrogen beam. Measurement of sheet concentration of metal atoms was realized by ToF SIMS method. The method sensitivity was 10~8 at. cm~(-2). Principal reason of parasitic metal particles occurrence in the beam and the methods for reduction of metal impurity concentration in AH beam was investigated.
机译:用自加热阴极形成由低压电弧放电源形成的大面积原子氢束的杂质组合物的结果。该研究是对18个金属元素进行的。基于原子氢气流动前后的Si样品表面上的金属原子的纸张浓度的测量方法用于测定原子氢束中的杂质组成。通过TOF SIMS方法实现了金属原子的纸张浓度的测量。方法灵敏度为10〜8。 cm〜(-2)。研究了寄生金属颗粒在梁中发生的主要原因及αH光束中的金属杂质浓度降低的方法。

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