A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing

摘要

This paper proposes a new method for measuring aperture jitter on an ADC output. It measures both the average ENOB loss and the worst-case ENOB loss due to aperture jitter. Because it adds only a negligible computation time to an existing ENOB test, it can also be used in an HV production environment without significantly increasing the overall test time.