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A Complete Analytic Surface Potential-Based Core Model for Undoped Cylindrical Surrounding-Gate MOSFETs

机译:基于完整的分析表面电位的磁芯模型,用于未掺杂的圆柱周围栅极MOSFET

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An analytic surface potential-based non-charge-sheet core model for cylindrical undoped surrounding-gate (SRG) MOSFETs is presented in this brief. Starting from the exact surface potential solution of the Poisson's equation in the cylindric surrounding-gate (SRG) MOSFETs, a single set of the analytic drain current expression in terms of the surface potential evaluated at the source and drain ends is obtasined from the Pao-Sah's dual integral without the charge-sheet approximation. It is shown that the derived drain current model is valid for all operation regions, allowing the SRG MOSFET characteristics to be adequately described from the linear to saturation and from the sub-threshold to strong inversion region without fitting ■ parameters, Moreover, the model prediction is also be verified by the 3-D numerical simulation.
机译:本简要介绍了用于圆柱形未掺杂的周围栅极(SRG)MOSFET的基于圆柱形的基于分析表面电位的非充电片芯模型。从圆柱周围栅极(SRG)MOSFET中的泊松等式的精确表面电位解决方案开始,在源极和排水末端评估的表面电位方面的单组分析漏极电流表达是溶解于PAO的Sah的双积分而没有充电纸近似。结果表明,导出的漏极电流模型对所有操作区域有效,允许SRG MOSFET特性从线性到饱和度以及从子阈值得到充分描述而不接合■参数,模型预测还通过3-D数模拟验证。

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