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Influence of Electroless Copper on IC Reliability

机译:化学铜对IC可靠性的影响

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摘要

The process of plating through holes (PTH) is inherent to modern PCB manufacturing. In an arena of increasing circuit density and layer counts, the reliability of the PTH process is under constant microscopic examination. The aim of electroless copper is to plate a conductive layer through a hole or into a blind microvia. In this context an interconnect (IC) refers to the copper to copper adhesion within the functional constraints of a circuit board. As these can include many inner layers, the inter connection quality is of prime concern. In addition the PTH process also inherits the issues from the preceding manufacture.
机译:通过孔(PTH)电镀的过程是现代PCB制造所固有的。在电路密度和层数增加的舞台中,PTH过程的可靠性在恒定的微观检查下。化学镀铜的目的是通过孔或盲微孔板将导电层。在这种情况下,互连(IC)是指电路板的功能约束内的铜粘附。由于这些可以包括许多内层,所以连接的间接质量是主要关注的。此外,PTH过程还继承了前一制造的问题。

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