首页> 外文会议>International Conference on Genetic and Evolutionary Computing >Genetic Algorithm and Semiconductor Device Model Parameter Extraction
【24h】

Genetic Algorithm and Semiconductor Device Model Parameter Extraction

机译:遗传算法和半导体器件模型参数提取

获取原文

摘要

In this paper, a novel method based on hybrid genetic algorithm (GA) was developed to extract parameters of analytical or part-analytical models. It needn't complex computation compared with conventional methods or other compound genetic algorithm. With a simple input file and opening model codes, it was easy to be modified for other models. Using this method, parameters of BSIMPD MOSFET threshold voltage were extracted, the simulation result with this method agrees well with the experimental result
机译:本文开发了一种基于混合遗传算法(GA)的新方法,提取分析或分析模型的参数。与传统方法或其他复合遗传算法相比,它不需要复杂的计算。使用简单的输入文件和打开模型代码,易于修改其他型号。使用这种方法,提取了BSIMPD MOSFET阈值电压的参数,使用该方法的仿真结果与实验结果很好

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号