Effects of Image Processing on Electron Diffraction Patterns Used for Nanobeam Diffraction Strain Measurements

摘要

Typical algorithms used for NBD analysis have been examined using statistical analysis in order to produce strain results with the lowest variance in a sample assumed to be at constant strain. Performing an autocorrelation of the incoming diffraction patterns has a strong effect on the strain. Paraboloid, circle, and ellipse peak fitting routines produce similar strain results.