首页> 外文会议>Kontaktverhalten und Schalten >Determination of Residual Lifetime of Electrical Contacts by Sonogram Analysis
【24h】

Determination of Residual Lifetime of Electrical Contacts by Sonogram Analysis

机译:声皮图分析测定电触点的剩余寿命

获取原文

摘要

To determine the residual lifetime of electrical contacts we have generated a statistical database to specify the best prediction parameter which was found out to be the contact mass. The mass of the contact was correlated with the time-frequency behaviour (sonogram) of a broadband acoustic impulse which was coupled into the contact piece. First results indicate a good correlation of the contact mass with an integrated area of the sonogramm. The measurement will lead to the determination of the residual lifetime of the contacts. Further improvements of the precision of residual lifetime determination are planned to be done by simulation to uncover relevant areas in the sonogram.
机译:为了确定电触点的剩余寿命,我们已经产生了统计数据库,以指定最佳预测参数,该参数被发现是接触质量的最佳预测参数。接触的质量与宽带声学脉冲的时频性能(超声图)相关联,该宽带声脉冲耦合到接触件中。第一个结果表明接触物质量与声学图的综合区域的良好相关性。测量将导致确定触点的残余寿命。计划通过模拟进行剩余寿命确定精度的进一步改进,以发现超声图中的相关区域。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号