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Thermoelectric properties of Mg2Si_(1-x)C_x crystals grown by the vertical Bridgman method

机译:垂直Bridgman方法生长的Mg2Si_(1-x)C_x晶体的热电性能

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Multicrystalline Mg2Si crystals were grown using a Brigdman method combined with a die-casting growth technique. Although molten and/or vapor-phase Mg at elevated growth temperatures exhibit high chemical reactivity with the surrounding crucible materials, the use of an alumina crucible with a BN coating allowed single phase crystal growth and Mg2Si of good crystalline quality. Incorporation of carbon into the Mg2Si was observed to form Mg2Si_(1-x)C_x. For x=0.01 and 0.03, a lower thermal conductivity and higher figure of merit than those of Mg2Si were observed in the temperature range from room temperature to 773 K. The maximum figure of merit was 0.62 at 773 K for a Mg2Si_(0.99)C_(0.01) sample.
机译:使用与压铸生长技术结合的Brigdman方法生长多晶体Mg2Si晶体。尽管升高的生长温度下的熔融和/或气相Mg与周围坩埚材料具有高化学反应性,但是使用氧化铝坩埚与BN涂层允许单相晶生长和Mg2SI的良好结晶品质。观察到碳将碳掺入Mg2Si中以形成Mg2Si_(1-x)C_x。对于X = 0.01和0.03,在室温至773k的温度范围内观察到比Mg2Si的较低的导热率和更高的优异图。最大优异图案为0.62,在773K下为Mg2Si_(0.99)C_ (0.01)样品。

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