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On Chip Surge Protection for GaN Power LEDs by ZnO Thin Film Varistor

机译:ZnO薄膜压敏电阻对GaN电源LED的芯片浪涌保护

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High electrostatic discharge(ESD) endurance capability is an important issue for extensive applications of power light emitting diodes (LEDs). Conventional ceramic varistors, based on sintered bulk zinc oxide (ZnO), with various metal oxides as additives have been widely used in surge protection devices by grounding the excess current for a long time. Those sintered bulk ZnO devices are known to exhibit high nonlineariry coefficient (α□50) and good reliability for many commercial applications. However, the sintering manufacture method limits the practicability of integrating bulk ZnO varistor with other semiconductor devices. In this paper, we report on the thin-film ZnO produced by sputtering system and post-heat treatment which has shown good varistor characteristics. The nonlinear coefficients (a) in the corresponding current -voltage (I-V) curve can up to 50 at a high electric field of 1.1 kV/cm, With efficiently resolving thermal generated by high injected current, this thin film varistor can conduct current to the density as high as 20A/cm~2 successfully. In addition, we connected the ZnO varistor with GaN power LEDs by gold wire bonding. This structure revealed an improved electrostatic discharge (ESD) ability of up to 400V. This wire bonding configuration will be modified to a flip-chip LED with the ZnO/Si submount in the future. Sputtering and annealing are two commonly used processes in general semiconductor manufacturing procedures which are adopted in our ZnO thin film deposition. Therefore, our proposed method has provided a new possible solution to integrate not only LEDs but also other semiconductor devices with thin film varistor having surge protection capability, especially to accomplish an on-chip surge protection.
机译:高静电放电(ESD)承受能力为发光二极管(LED)的光功率的广泛应用的一个重要问题。常规陶瓷压敏电阻,基于氧化物烧结散装锌(ZnO),以及各种金属氧化物作为添加剂已通过接地的过载电流很长时间被广泛地应用于浪涌保护器件。这些烧结整体ZnO装置是已知的表现出高nonlineariry系数(α□50)和良好的可靠性的许多商业应用。然而,该烧结制造方法限制与其它半导体器件集成块状ZnO非线性电阻的实用性。在本文中,我们对薄膜的ZnO产生由已经显示出良好的压敏电阻特性的溅射系统和后热处理报告。非线性系数(a)以相应的电流 - 电压(IV)曲线可以高达50以1.1千伏/厘米的高电场,随着有效地解决由热产生的高注入电流,该薄膜可以变阻器传导电流到密度高达20A / cm〜2的成功。此外,我们连接在ZnO非线性电阻用的GaN功率LED由金线接合。此结构揭示至400V的改进的静电放电(ESD)的能力。这引线接合结构进行修改,以倒装芯片在将来在ZnO /硅装配件LED。溅射和退火是其在我们的氧化锌薄膜沉积在采用一般的半导体制造程序两种常用的方法。因此,我们提出的方法提供了新的可能的解决方案集成不仅发光二极管,而且与具有薄膜压敏电阻的浪涌保护能力的其它半导体器件,尤其是完成一个片上的浪涌保护。

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