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Hydrogen Sensors Based on Percolation and Tunneling in films of Palladium Clusters

机译:基于钯簇薄膜渗透和隧道的氢传感器

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We describe the formation of hydrogen sensors by deposition of Pd clusters onto silicon dioxide coated silicon substrates with electrical contacts defined by a simple shadow masking technique. The clusters are prepared by sputtering in a gas aggregation source. The sensors are characterized by exposure to hydrogen in a simple flow chamber and by measuring the temperature dependence of the sensor resistance. Sensors with cluster coverage greater than the percolation threshold form "thin film" type sensors which exhibit a small increase in resistance on exposure to hydrogen, consistent with the increase in resistivity of bulk Pd on absorption of hydrogen. Sensors with coverage smaller than the percolation threshold form sensors which exhibit a much larger decrease in resistance on exposure to hydrogen. The response of these "percolating-tunneling" sensors is due to the absorption of hydrogen by the Pd clusters, which causes the runnel gaps in the film to decrease in size, leading to an increase in conductance. Finally we describe tunneling sensors, where gold islands are grown on the substrate prior to cluster deposition, and which exhibit similar characteristics to the percolating-tunneling sensors.
机译:通过将Pd簇沉积到二氧化硅涂覆的硅基板上,通过简单的阴影掩蔽技术限定的电触点来描述氢传感器的形成。通过在气体聚集源中溅射来制备簇。传感器的特征在于在简单流动室中接触氢气,并通过测量传感器电阻的温度依赖性。具有簇覆盖的传感器大于渗透阈值形式的“薄膜”型传感器,其表现出对氢气暴露的耐受性小幅增加,这与散装Pd的吸收电阻率的增加一致。具有小于覆盖物的传感器比渗透阈值形成传感器,其在暴露于氢气时表现出更大的抗性降低。这些“渗透隧道”传感器的响应是由于PD簇吸收氢,这导致膜中的脉冲间隙尺寸降低,导致电导率增加。最后,我们描述了在簇沉积之前在基板上生长金岛的隧道传感器,并且对渗透隧道传感器具有类似的特性。

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