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Conductivity of self-organized silicon quantum dots embedded in silicon dioxide

机译:嵌入二氧化硅中的自组织硅量子点的电导率

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Silicon quantum dots (SiQDs) embedded in silicon dioxide are being investigated as a means of engineering a wide band gap semiconductor for potential application in silicon based tandem solar cells. The conductivity of the self-organized silicon dots embedded in the oxide is an important parameter in characterizing the electronic transport mechanisms. We present in this paper our initial results on measurement of the resistivity as a function of temperature. In order to reduce contact resistance aluminium contacts are annealed to induce spiking through upper layers of oxide and thus producing a large contact surface area. Samples with various initial silicon rich concentrations are compared. Activation energies for various tentative conduction mechanisms are calculated from this data and possible conduction models presented.
机译:正在研究嵌入二氧化硅中的硅量子点(SIQDS)作为工程方​​法,用于宽带隙半导体,用于基于硅基串联太阳能电池的潜在应用。嵌入在氧化物中的自组织硅片的电导率是表征电子传输机构的重要参数。我们在本文中展示了我们的初始结果,以测量电阻率作为温度的函数。为了减少接触电阻,铝触头被退火,以诱导氧化物上​​层的尖刺,从而产生大的接触表面区域。比较具有各种初始硅富浓度的样品。用于各种暂定传导机制的激活能量由该数据计算,并且提供了可能的传导模型。

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