Electron Microscopy Investigation of the Role of Surface Steps in the Generation of Dislocations during MOCVD Growth of GaN on 4H-SiC

摘要

Through the use of specially-prepared on-axis SiC substrates with patterned mesa tops completely free of atomic-scale surface steps, we have previously reported the growth of high-quality GaN heteroepitaxial films with greatly reduced threading dislocation densities on the order of 10~7/cm~2. In these films, we reported a defect substructure in which lateral a-type dislocations are present in the nucleation layer but do not bow into threading dislocations during the subsequent GaN growth. This study focuses further on the role of SiC substrate surface steps in the generation of misfit, a-type, and threading dislocations at the heteroepitaxial interface. By using weak-beam imaging (both to eliminate Moire effects and to observe narrow dislocation images) from plan-view transmission electron microscopy (TEM), we identify dislocations generated on stepped and unstepped mesas and compare their geometries. We observe that misfit dislocations nucleated on an unstepped SiC mesa are confined to one set of a-type Burgers vectors of the form g=1/3, straight and well-ordered so that they are less likely to interact with each other. On the other hand, misfit dislocation structures on a stepped SiC mesa surface are not nearly as well-ordered, having bowed structure with threading dislocations that appear to nucleate at SiC surface steps.