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Current research activities in the field of multilayer for EUV, soft x-ray and x-rays in IPOE

机译:IPOE中的EUV,软X射线和X射线的多层领域的研究活动

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The present status of studies on EUV, soft x-ray and x-ray multilayer in the Institute of Precision Optical Engineering (IPOE) is briefly reviewed. With the aim of realizing a Mach-Zender interferometer working at 13.9nm, we have developed a semitransparent beam splitter with multilayer deposited on the back side of a silicon nitride membrane. On the basis of the experimental optical properties of the beam splitter, design has been performed to define the multilayer structure that provides the highest product of reflectivity and transmission. Optimized Mo/Si multilayer has been successfully deposited on the back side of a silicon nitride membrane by use of the magnetron sputtering. Measurements by means of a reflectometer in Beijing Synchrotron Radiation Facility at 13.9nm and at an angle of 7.2° provide a reflectivity of 20% and a transmission of 22%. Such a beam splitter has been used for X-ray Mach-Zender interferometer at 13.9nm. The broadband multilayer analyzer in the range between 12.4nm and 20nm is designed, and made which can deviate the Quasi-Brewster's angle several degree and show very high polarization. The main feature of our design approach is the use of an analytical solution as a starting point for direct computer search, and the desired results can be given in a reasonable time. The method can be applied in different spectral range for suitable material combination. Supermirrors with broad angular band working at different wavelength such as Cu Kcc line are designed, manufactured and measured. The results show that the performance of the supermirrors is in agreement with designed data.
机译:研究对EUV现状,软X射线和X射线多层的精密光学工程学会(IPOE)是简要回顾。用干涉在13.9nm的工作实现的马赫 - 曾德尔的目的,我们已经开发出具有多层沉积在氮化硅膜的背面侧的半透明分束器。在分束器的实验性的光学特性的基础上,已进行设计,以限定多层结构,可提供反射率和透射的最高的产品。优化的Mo / Si多层已通过使用磁控溅射的被成功地沉积在硅氮化物膜的背面侧。通过在13.9nm在北京同步辐射装置反射计的装置和在7.2的角度测量°提供的20%的反射率和22%的透射率。这样的分束器已经用于在13.9nm透视马赫 - 曾德尔干涉仪。在12.4nm到20nm之间的范围中的宽带多层分析仪的设计,并且由能够偏离准布儒斯特角几个度和显示出非常高的极化。我们的设计方法的主要特点是使用的分析解决方案,用于直接计算机搜索的起始点,以及所期望的结果可以在合理的时间内给出。该方法可以在不同的光谱范围内被应用于合适的材料的组合。具有宽角度带在超反射不同波长的工作如Cu KCC线的设计,制造和测量。结果表明,超反射的性能与设计的数据一致。

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