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Cooling Challenges and Best Practices for High Density Data and Telecommunication Centers

机译:冷却挑战和高密度数据和电信中心的最佳实践

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Power and power density increase on the level of integrated circuit (IC) has been exploding following Moore's law for more than two decades [1]. Riding on the trend of IC density increase, densities on chassis enclosure as well as cabinet levels have also been increasing dramatically. A standard cabinet measuring approximately W610mm×H1880mm×D102mm that used to house only one or two computers just a decade or so ago can house more than 60 so called blade computers. Dramatic density increases inevitably lead to dramatic power consumption and heat dissipation increase. While the consequences of failure to effectively remove heat from IC devices are well understood [2], the ramifications of dramatic chassis/cabinet density and heat dissipation increases on operating environments gained recognition only recently [3,4,5,6]. This paper includes the outlines of a book titled "Thermal Guidelines for Data Processing Environments" [7] written by a technical committee called Mission Critical Facilities, Technology Spaces and Electronic Equipment (TC9.9) of American Society of Heating, Refrigeration, and Air-conditioning Engineers (ASHRAE). The book focuses on the convergence of data processing product specifications among major equipment vendors and outlines the data center environmental requirements that are necessary to maintain mission critical operations. The paper also describes some time tested best practices for achieving mission critical and high availability data center environments that involve high density IT equipment.
机译:集成电路(IC)水平的电力和功率密度增加一直在莫尔的定律爆炸两十多年[1]。乘坐IC密度增加的趋势,底盘外壳的密度以及橱柜水平也在大幅增加。一个标准柜,测量大约W610mm×H1880mm×D102mm,用于只有十年左右的只容纳一台或两台电脑,可以在60多个中置于60多个所谓的刀片计算机。剧烈的密度不可避免地导致戏剧性的功耗和散热增加。虽然未能有效地从IC器件中消除热量的后果很好地理解[2],但是在最近的操作环境中,戏剧性底盘/机壳密度和散热的后果增加了识别[3,4,5,6]。本文包括一本标题为“数据处理环境的热指南”[7]的书籍的概述,由美国加热,制冷和空气协会的关键任务设施,技术空间和电子设备(TC9.9)编写的技术委员会 - 监管工程师(Ashrae)。本书专注于主要设备供应商中数据处理产品规格的融合,并概述了维护关键任务操作所需的数据中心环境要求。本文还介绍了一些时间测试的最佳实践,用于实现涉及高密度IT设备的关键任务和高可用性数据中心环境。

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