首页> 外文会议>Annual Interational Wafer-Level Packaging Conference >WAFER LEVEL STACKING OF 8 TO 10 DICE PER MM FOR CONSUMER PRODUCTS - WIRELESS DIE-ON-DIE 'WDoD'
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WAFER LEVEL STACKING OF 8 TO 10 DICE PER MM FOR CONSUMER PRODUCTS - WIRELESS DIE-ON-DIE 'WDoD'

机译:为消费品堆叠8到10个骰子为消费品 - 无线模具芯片“WDOD”

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The approach which we have used for "WDoD" is similar to the one which we have used as of 1990 when we launched the 3-D interonnection, i.e.: - use of standard components and available off-the-shelf. - test of each level prior to stacking. The use of "WDoD" level process has not fundamentally changed the approach: in fact, we did not choose the same direction as the one which is currently dominant, i.e.: use of non-thinned wafers; use of standard wafers, which means non modified (no interconnection through holes in the silicon); Building of Known Good Rebuilt wafers in order not to be faced again with the problems of multi chips modules and Wafer Scale Integration, which have failed. As far as these large volume productions are concerned, 3D PLUS works as a fabless and as IP provider. We have already identified a foundry and are looking for some others.
机译:我们用于“WDOD”的方法类似于我们在推出的3-D互联时使用的方法,即 - 使用标准组件和现成的现成。 - 在堆叠之前测试每个级别。使用“WDOD”级过程并没有从根本上改变这种方法:事实上,我们没有选择与目前占主导地位的相同方向,即:使用非稀释晶片;使用标准晶片,这意味着未改变(无硅孔中没有孔);众所周知的良好重建晶片的建设,以便在多芯片模块和晶圆比集成的问题再次面对,这已经失败了。就这些大批量制作而言,3D加上作为无晶圆厂和IP提供商的工作。我们已经确定了一个铸造厂,正在寻找其他一些。

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