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Eliminating Unwanted Test Fixture Effects in Multi-Gigabit Device Measurements: S-Parameter Deembedding and Thru-Reflect-Line (TRL) Calibration Techniques

机译:消除了多千兆位器件测量中的不需要的测试夹具效果:S参数解贴和通过反射线(TRL)校准技术

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Network analyzer error-correction (calibration) removes systematic error, but typically establishes the calibration reference plane at the end of the test cables, not at the input of the device-under-test (DUT). The test fixture becomes an intervening network between the calibration and measurement reference planes. The unwanted fixture effects can be removed using S-parameter deembedding, or avoided using Thru-Reflect-Line (TRL) calibration techniques, which moves the calibration reference plane to the input of the DUT, and makes the test fixture itself part of the systematic error correction. This tutorial will describe the development and validation of S-parameter models for fixture deembedding, will demonstrate TRL design and implementation, will compare the results, will discuss the merits of each technique, and will provide selection criteria.
机译:网络分析仪纠错(校准)删除系统误差,但通常在测试电缆末尾建立校准参考平面,而不是在测试设备的输入时(DUT)。测试夹具成为校准和测量参考平面之间的介入网络。可以使用S参数解贴来除去不需要的夹具效果,或者使用直通线(TRL)校准技术避免,这将校准参考平面移动到DUT的输入,并使测试夹具本身成为系统的一部分纠错。本教程将描述用于夹具Deembedding的S参数模型的开发和验证,将展示TRL设计和实现,将比较结果,将讨论每个技术的优点,并提供选择标准。

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