Sensitivity analysis of multiport S-parameter measurements due to nonideal TRL calibration standards

摘要

In this paper, a detailed analysis of n-port vector network analyzer measurement uncertainties due to nonideal standards for multiport through-reflect-line calibration is presented. By using the concept of general node equations, the error correction equation is simplified by the matrix operation; thus, a generalized formula for the deviations of the measured S parameters with respect to the error terms is derived, which can be implemented in further analysis of multiport measurement uncertainties applying arbitrary calibration method based on 4n-term error model. The final expressions for the sensitivity coefficients of S parameters with simple and clear form provide a deeper understanding of error propagation mechanisms.