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Analysis of photoluminescence decay of excitons in CuInS2 crystals

机译:CUINS2晶体中激子的光致发光衰减分析

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The time-resolved photoluminescence of free and bound excitons in bulk single-crystal CuInS2 grown by the traveling heater method is examined. It is found that radiative decay of the free exciton at 1.535 eV and the bound exciton at 1.530 eV is exponential with two characteristic decay-times while that of the bound excitons at 1.525 and 1.520 eV is well-represented by a single exponent at low temperatures. The radiative lifetimes of the free exciton and the bound excitons at 1.530, 1.525, and 1.520 eV are obtained to be 320 ps, 500 ps, 2.1 ns, and 3.5 ns, respectively. A thermal release process of the observed bound excitons is discussed in terms of the obtained activation energy. The capture center cross-section for free exciton is also estimated. According to our estimates, a neutral charge is to be assigned to the defect centers associated with the observed bound excitons.
机译:检查由行驶加热器方法生长的散装单晶Cuins2中自由和结合激子的时间分辨的激光致发光。结果发现,1.535eV的自由激子的辐射衰减和1.530eV的结合激子是具有两个特征衰减时间的指数,而在1.525和1.520eV的结合激子上的结合激子是由低温下指数的良好代表的。 。自由激子的辐射寿命和1.530,1.525和1.520eV的结合激子分别获得320 ps,500 ps,2.1ns和3.5ns。在所获得的活化能量方面讨论了观察结合的激子的热释放过程。还估计了自由激子的捕获中心横截面。根据我们的估计,将分配中立的费用,将与观察到的联合激子相关的缺陷中心分配给缺陷中心。

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