首页> 外文会议>International Conference on Physics, Chemistry and Application of Nanostructures >MORPHOLOGY, OPTICAL PROPERTIES AND BAND STRUCTURE PARAMETERS OF MONOCRYSTALLINE SILICON MODIFIED BY COMPRESSION PLASMA FLOW
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MORPHOLOGY, OPTICAL PROPERTIES AND BAND STRUCTURE PARAMETERS OF MONOCRYSTALLINE SILICON MODIFIED BY COMPRESSION PLASMA FLOW

机译:通过压缩等离子体流动改性单晶硅的形态学,光学性质和带结构参数

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Morphology, optical properties, crystal and electronic structure of monocrystal siliconafter plasma processing, depending on initial voltage of magnetoplasma compressor (MPC), have been studied. It was shown that periodic surface structures are formed on silicon only in the short range of initial MPC voltages (2.8-3.2 kV), but at higher initial voltages (3.4-3.6 kV) the formation of "crater" and carrying out of the part of the material on its periphery till the moment of crystallization is observed without the formation of surface structures. The increase of the silicon lattice constant has been observed after plasma processing at all initial voltages that correlate with the decrease of band-gap energy by data of optical spectroscopy.
机译:已经研究了单晶硅硅化物等离子体处理的形态学,光学性质,晶体和电子结构,这取决于磁通成型压缩机(MPC)的初始电压。结果表明,在初始MPC电压(2.8-3.2kV)的短程范围内仅在硅中形成周期性表面结构,但在较高的初始电压(3.4-3.6 kV)中形成“火山口”并延伸部分在不形成表面结构的情况下观察到其周边的材料,直到未形成表面结构。在等离子体处理之后在所有初始电压下观察到硅晶格常数的增加,该初始电压与光谱数据数据的带间隙能量的降低相关。

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