首页> 外文会议>Society of Photo-Optical Instrumentation Engineers Conference on Lightmetry >Nephelometer for determination of the Mueller matrix optical properties of objects
【24h】

Nephelometer for determination of the Mueller matrix optical properties of objects

机译:用于确定物体穆勒矩阵光学性质的浊度计

获取原文

摘要

A laser nephelometer for determination of Mueller matrices of the optical properties of objects transforming radiation has been designed. The nephelometer scheme and operation method are described. There have been derived formulas for matrix elements calculation with operating of the nephelometer designed. The polarization characteristics of the probing radiation in the nephelometer are changed by different setting of the first waveplate retarder, and the polarization analysis of the scattered light is carried out with the use of the Fourier expansion of the signal recorded by a photodetector in the process of rotation of the second retardation waveplate retarder placed in front of an immovable analyzer. The absolute error of the Mueller matrix elements measurement have been determined experimentally.
机译:设计了一种激光浊度计,用于确定变换辐射的物体光学性质的穆勒矩阵。描述了尼触线计方案和操作方法。通过设计设计的初学者进行矩阵元素计算,已经获得了矩阵元素的公式。通过第一波片延迟器的不同设置改变了浊度计中的探测辐射的偏振特性,并且利用光电探测器记录的信号的傅里叶扩展来执行散射光的偏振分析将第二延迟波片延迟器旋转放置在不可移动的分析仪前面。实验确定了穆勒矩阵元件测量的绝对误差。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号