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Growth Surface morphology and optical properties of Gallium nitride nanowires

机译:氮化镓纳米线的生长表面形态和光学性质

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We report on the growth mechanism, structural and optical characterstics of Gallium nitride nanowires prepared on sapphire substrates (0001) by reacting metal gallium with Gallium nitride powder and ammonia in the temperature range of 800 to 1050°C. GaN nanowires samples were characterized by using X-ray diffraction technique which shows wurtzite structure of GaN nanowires and the lattice parameters are calculated. Scanning electron microscopy images reveals that the dimension of the nanowires are around 60 - 80 nm and the length of 1 - 2 millimeters. Three Raman modes of GaN have been observed at frequencies 530, 554 and 564 cm~(-1). Photoluminescence spectrum reveals the band edge at 3.4 eV and gives yellow luminescence.
机译:通过使金属镓与氮化镓粉末和氨在800至1050℃的温度范围内的金属镓反应,报告在蓝宝石衬底(0001)上制备的氮化镓纳米线的增长机理,结构和光学特征报告。通过使用显示GaN纳米线的纯钛矿结构的X射线衍射技术,表征了GaN纳米线样品的表征。计算晶格参数。扫描电子显微镜图像显示纳米线的尺寸约为60-80nm,长度为1 - 2毫米。在频率530,554和564cm〜(-1)时已经观察到GaN的三种拉曼模式。光致发光光谱显示3.4 EV的带边缘并给出黄色发光。

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