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RF ON-CHIP PASSIVE COMPONENTS FABRICATED BY CMOS COMPATIBLE Cu INTERCONNECT TECHNOLOGY

机译:由CMOS兼容CU互连技术制造的射频片上无源元件

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摘要

RF on-chip passive components, inductors, capacitors and resistors, have been fabricated with advanced Cu interconnect technology, which is compatible with nowadays 0.18μm CMOS backend process. The Q-values, with the lowest value of 11, for a set of inductors with inductance from 0.4 nH to 11 nH have been reported on low resistivity silicon substrates. MIM and MIMIM structure for on-chip capacitors have been studied. 1.75fF/μm{sup}2 capacitance has been achieved with MIMIM capacitors. Very high uniformity for inductors on wafers and low leakage current for capacitors can also be achieved in our fabrication.
机译:RF片上无源元件,电感器,电容器和电阻器已采用先进的Cu互连技术制造,与现在0.18μmCMOS后端过程兼容。在低电阻率硅基板上报道了具有电感的一组电感的电感的Q值,该电感来自0.4nh至11nh。研究了用于片上电容器的MIM和MIMIM结构。 1.75FF /μm{SUP} 2通过MIMIM电容器实现了电容。在我们的制造中也可以实现对晶片上的电感器和电容器低漏电流的非常高的均匀性。

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