首页> 外文会议>Advances in Materials Problem Solving with the Electron Microscope Conference >Relationship between structure and luminescent properties of epitaxial grown Y{sub}2O{sub}3:Eu thin films on LaAlO{sub}3 substrates
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Relationship between structure and luminescent properties of epitaxial grown Y{sub}2O{sub}3:Eu thin films on LaAlO{sub}3 substrates

机译:外延生长y {Sub} 2O {Sub} 3:Laalo {Sub} 3基板上的eu薄膜的关系与发光特性

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Cathodoijiminescence images of individual pores have been obtained at nanometer resolution in europium-activated yttrium oxide (Y{sub}2o{sub}3:Eu) (001) thin films, epitaxially grown on LaAlO{sub}3 (001) substrates. Comparison with Z-contrast images, obtained simultaneously, directly show the "dead layer" to be about 5 nm thick. This "dead layer" is the origin of the reduced emission efficiency with increasing pore size. Pore sizes were varied by using different substrate temperatures and laser pulse repetition rates during film growth. These films are epitaxially aligned with the substrate, which is always Al terminated.
机译:在纳米分辨率在铕 - 活化的氧化钇(Y {} 2O} 3:Eu)(001)薄膜上以纳米分辨率获得了个体孔的阴区图像,在Laalo {Sub} 3(001)衬底上外延生长。与同时获得的Z-对比度图像的比较直接显示“死层”为约5nm厚。这种“死层”是降低发射效率的起源,随着孔径的增加。通过在薄膜生长期间使用不同的基板温度和激光脉冲重复速率来改变孔径。这些膜与基材外延对齐,总是终止的。

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