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Microwave characterization and comparison of adhesive flip chip interconnects

机译:微波表征和粘合倒装芯片互连的比较

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S-parameter measurement and impedance parameter extraction of adhesive flip-chip interconnect were performed using a microwave network analysis. A test flip chip was assembled on a PCB substrate using anisotropic conductive adhesives (ACAs). S-parameters of on-chip and substrate were separately measured in the frequency range of 200 MHz to 20 GHz using a microwave network analyzer HP85 10 and cascade probe. And the cascade transmission matrix conversion was performed. The same measurements and conversion techniques were conducted on the assembled test chip and substrate at the same frequency range. Then impedance values in ACA flip-chip interconnection were extracted from cascade transmission matrix. By using this extraction procedure, low-k filler(SiO{sub}2) incorporation effects & bump metallurgy(Ni, Ni/Cu bilayer) effects on high frequency behavior of ACAs were investigated and quantitatively compared that of stud bump flip chip interconnects. The extracted model parameters of adhesive flip chip interconnects were analyzed with the considerations of the characteristics of material and the design guideline of ACA flip chip for high frequency applications was provided.
机译:使用微波网络分析进行粘合剂倒装芯片互连的S参数测量和阻抗参数提取。使用各向异性导电粘合剂(ACAs)在PCB基板上组装测试倒装芯片。使用微波网络分析仪HP85 10和级联探头,在芯片和基板的频率范围内单独测量片上和衬底的S参数。并进行级联传输矩阵转换。在相同频率范围的组装测试芯片和基板上进行相同的测量和转换技术。然后从级联传输矩阵中提取ACA倒装芯片互连中的阻抗值。通过使用该提取过程,研究了对突出的ACA的高频行为的Low-K填充物(SiO {Sub} 2)掺入效果和凸块冶金(Ni,Ni / Cu双层)效应和定量比较螺柱凸屑芯片互连的高频行为。通过考虑材料特性的考虑,分析了粘合剂倒装芯片互连的提取模型参数,并提供了高频应用的ACA倒装芯片的设计指南。

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