Long-term degradation mechanism of organic light emitting devices based on small molecules

摘要

The intrinsic degradation of tris(8-hydroxyquinoline) aluminum (AlQ{sub}3)-based organic light emitting devices, that leads to the long-term decrease in the electroluminescence efficiency of the devices operated under constant current conditions,is studied. The injection of holes in AlQ{sub}3 is found to be the main factor responsible for device degradation. OLEDs with dual HTLs in different arrangements are also presented to demonstrate the proposed degradation mechanism. The role of variousapproaches to increase OLED lifetime, such as, doping the hole transport layer, introducing a buffer layer at the hole-injecting contact, or using a mixed emitting layer of hole and electron transporting molecules, is explained.