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Group III metal sulfide thin films from single-source precursors by chemical vapor deposition (CVD) techniques

机译:III组通过化学气相沉积(CVD)技术来自单源前体的金属硫化物薄膜(CVD)技术

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Several single-source precursors including In(SOCN{sup}iBu{sub}2){sub}3, In(S{sub}2CNMeHex){sub}3 and Ga(S{sub}2CNMeR){sub}3, (R = Et, Bu, Hex) have been prepared and used for the deposition of Group 13 metal sulfide thin films. Theα- andβ-In{sub}2S{sub}3 thin films on borosilicate glass andα-Ga{sub}2S{sub}3 thin films on GaAs(111) single crystal substrates were prepared from the precursors by various chemical vapour deposition (CVD) techniques. These semicondcuting materials have been characterized by XRD, SEM, XPS and EDAX.
机译:包括在(SOCN {SUP} IBU {sub} 2)中的几个单源前兆,在(s {sub} 2cnmehex){sub} 3和ga(s {sub} 2cnmer){sub} 3中,(已经制备了R = Et,Bu,Hex)并用于沉积第13组金属硫化物薄膜。通过各种化学气相沉积从前体制制备硼硅酸盐玻璃和α-j} 2S {sub} 2 {sub} 3薄膜,通过各种化学气相沉积从前体制制备GaAs(111)单晶衬底上的薄膜CVD)技术。这些半导体材料的特征在于XRD,SEM,XPS和EDAX。

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