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Nano-encapsulated ZnS:Ag phosphors for field emission flat panel display applications

机译:纳米封装的ZNS:用于场发射平板显示器应用的Ag磷光体

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ZnS:Ag phosphor particles were encapsulated with nano-meter thick films of indium tin oxide (ITO) in order to slow the degradation process of the phosphor as well as to reduce the amount of sulfur species out-gassing from the phosphor. Cathodoluminescent (CL) degradation measurements were performed at two different vacuum conditions (6.1 × 10{sup}(-7) Torr and 1×10{sup}(-5) Torr). The CL degradation curves showed that the ITO coating improved the brightness lifetime. X-ray photoelectron spectroscopy was used to determine the chemical changes on the coated and uncoated degraded particle surfaces. CL images were used to show the loss of brightness from the surface of the phosphor particles. Then energy dispersive x-ray spectroscopy was used to measure the ratio of the area under the zinc and sulfur peaks on an atomic weight %, which showed a loss in sulfur during the degradation experiments.
机译:ZnS:Ag磷光体颗粒用纳米计厚的氧化铟锡(ITO)膜包封,以减缓磷光体的降解过程,以及减少从磷光体的硫种类的量。在两个不同的真空条件下进行阴极发光(CL)降解测量(6.1×10 {sup}( - 7)托和1×10 {sup}( - 5)torr)。 CL劣化曲线显示ITO涂层改善了亮度寿命。 X射线光电子能谱用于确定涂覆和未涂覆的降解的颗粒表面上的化学变化。 CL图像用于显示来自磷光体颗粒表面的亮度损失。然后使用能量分散X射线光谱法测定锌和硫峰下的面积与原子重量%的比率,其在降解实验期间显示硫的损失。

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