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High Current Field Emission from Large-Area Indium Doped ZnO Nanowire Field Emitter Arrays for Flat-Panel X-ray Source Application

机译:用于平板X射线源应用的大面积铟掺杂ZnO纳米线发射器阵列的高电流场发射

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摘要

Large-area zinc oxide (ZnO) nanowire arrays have important applications in flat-panel X-ray sources and detectors. Doping is an effective way to enhance the emission current by changing the nanowire conductivity and the lattice structure. In this paper, large-area indium-doped ZnO nanowire arrays were prepared on indium-tin-oxide-coated glass substrates by the thermal oxidation method. Doping with indium concentrations up to 1 at% was achieved by directly oxidizing the In-Zn alloy thin film. The growth process was subsequently explained using a self-catalytic vapor-liquid-solid growth mechanism. The field emission measurements show that a high emission current of ~20 mA could be obtained from large-area In-doped sample with a 4.8 × 4.8 cm2 area. This high emission current was attributed to the high crystallinity and conductivity change induced by the indium dopants. Furthermore, the application of these In-doped ZnO nanowire arrays in a flat-panel X-ray source was realized and distinct X-ray imaging was demonstrated.
机译:大面积氧化锌(ZnO)纳米线阵列在平板X射线源和探测器中具有重要应用。掺杂是通过改变纳米线导电性和晶格结构来提高发射电流的有效方法。在本文中,通过热氧化方法在氧化铟锡涂覆的玻璃基板上制备大面积铟掺杂的ZnO纳米线阵列。通过直接氧化Zn合金薄膜,实现掺杂高达1at%的铟浓度。随后使用自催化气相 - 固体生长机制来解释生长过程。场发射测量结果表明,〜20mA的高发射电流可以从带有4.8×4.8cm2区域的大面积掺杂样品获得。这种高发射电流归因于铟掺杂剂诱导的高结晶度和电导率变化。此外,实现了这些掺杂的ZnO纳米线阵列在平板X射线源中的应用,并且证明了不同的X射线成像。

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