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Studies of the growth and local atomic bonding of a-C_xN_yH_z films

机译:A-C_XN_YH_Z薄膜生长和局部原子键的研究

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A systematic study of the growth and local atomic bonding (LAB) of a series of a-C_xN_yH_z alloy films prepared via plasma enhanced chemical vapor deposition (PECVD) from mixtures of NH_3/C_2H_2 and N_2/C_2H_2 is presented. The effects of the reactants and their ratio on the film composition and bonding of hydrogen, the optical constants, and the optical energy gap have been determined. It is found that the presence of nitrogen and hydrogen in the plasma decreases the net film deposition rate due to enhanced etching and that incorporation of nitrogen into the film is limited to N/Capprox approx 0.1. For the films deposited from N_2/C_2H_2 as the concentration of N in the film increases, the concentration of C also increases while that of H decreases. No evidence for the type of bonding expected in the theoretically-predicted C_3N_4 compound has been found. It is observed that hydrogen is preferentially bonded to nitrogen and there is evidence for N-H...N hydrogen bonding in the films. The predictions of the free energy model (FEM) previously developed for the bonding in a-C_xN_yH_z alloys are compared with these experimental results. The importance of entropy in determining the most stable state of these alloys is demonstrated. The FEM successfully predicts and explains some of the experimentally-observed properties of the alloys.
机译:提出了通过等离子体增强的化学气相沉积(PECVD)从NH_3 / C_2H_2和N_2 / C_2H_2的混合物制备的一系列A-C_XN_YH_Z合金膜的系统研究。已经确定了反应物的影响及其对膜组成和氢,光学常数和光学能隙的粘合的比率。发现等离子体中的氮和氢的存在降低了由于增强的蚀刻而降低了净膜沉积速率,并且将氮气掺入薄膜中仅限于N / Capprox大约0.1。对于沉积从N_2 / C_2H_2沉积的薄膜作为膜中的N浓度增加,C的浓度也增加而H降低。没有发现在理论上预期的C_3N_4化合物中预期的键合类型的证据。观察到氢优先与氮键合,并且在薄膜中存在N-H ... N氢键的证据。将先前为A-C_XN_YH_Z合金中键合的自由能模型(FEM)的预测与这些实验结果进行了比较。熵在确定这些合金的最稳定状态时的重要性。 FEM成功地预测并解释了合金的一些实验观察性的性质。

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