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Effects of substrate bias on the properties of a-C:H films by DC saddle-field plasma enhanced CVD

机译:直流鞍木浆液增强CVD对底物偏差对A-C:H膜性能的影响

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Hydrogenated amorphous carbon (a-C:H) films were deposited on p-type Si(100) at room temperature by DC saddle-field plasma enhanced CVD using pure methane gas and diluted methane gas by inert gas. The effect of substrate bias (V_s) from 0 V to 400 V on deposition rate, hydrogen content, chemical bonding of the films have been investigated. FT-IR spectrum shows that a-C:H films consist of sp~2 and sp~3 bondings and the relative intensity ratio of sp~2 and sp~3, I(sp~2)/I(sp~3), decreases from 0.28 to 0.19 as the substrate bias changes from 0 V to 400 V. Deposition rates of the films rapidly decrease with increasing V_s up to 200 V, and then slightly decrease over V_s = 200 V. The hydrogen content of the films increase as V_s goes higher and the number of C-H bonds of a-C:H shows the same trend. Only in the range of V_s=0 V and V_s=100 V the Raman band of graphite and disorder is observed. The emission of white photoluminescence (PL) light from the films is observed with the naked eye even at room temperature. The intensity of PL has a miximum at V_s=200 V, then decreases as the V_s changes from 200 V to 400 V. The PL peak shifts to higher energy from 2.15 eV at 100V to 2.45 eV at V_s=400 V. The PL at V_s = 400 V was two times stronger without a peak shift by using an inert gas dilution into methane source compared with that of a film deposited using pure methane.
机译:氢化非晶碳(α-C:H)的膜在室温下通过DC鞍场等离子体增强CVD使用纯甲烷气体和稀释的甲烷气体由惰性气体沉积在p-型Si(100)。衬底偏置(V_S)从0V至400V上的沉积速率,氢含量的影响,所述薄膜的化学结合进行了研究。 FT-IR光谱显示,AC:H膜由SP的〜2和SP〜3间的键所和SP的相对强度比〜2和SP〜3,I(SP〜2)/ I(SP〜3),从减小0.28〜0.19如从0V衬底偏置变化的膜的400个V.沉积速率随着V_S高达200伏,然后迅速降低超过V_S = 200 V.略微降低薄膜的氢含量增加,因为V_S推移更高和交流的CH键的数目:H显示了相同的趋势。仅在V_S = 0V和V_S = 100V的范围内的石墨和无序的拉曼频带观察到。的白色光致发光(PL)光从膜的发射即使在室温下用肉眼观察到。 PL的强度具有在V_S = 200V的miximum,然后随着所述V_S从200伏至400点。PL峰位移在变化到更高的能量从在100V 2.15电子伏特到在V_S = 400伏。PL 2.45电子伏特V_S = 400伏更强两次而不通过使用惰性气体稀释成甲烷源与使用纯甲烷沉积的膜相比,一个峰值偏移。

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