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Effect of high concentrationof defect states at PS/c-Si heterointerfacer on transport properties of Al/PS/c-Si photodiode structure

机译:PS / C-Si异化表面高浓度缺陷态对Al / PS / C-Si光电二极管结构的运输性能影响

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摘要

Current-voltage characteristics, photosensitivity, frequency dependence of impedance, and electron beam induced current were measured for Al/porous silicon/c-Si structures with porous silicon (PS) layers of 60 and 80
机译:对具有60和80的多孔硅(PS)层的Al /多孔硅/ C-Si结构测量电流 - 电压特性,光敏,阻抗的频率依赖性和电子束感应电流

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