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Size Effects on DC and Low-Frequency-Noise Characteristics of Epitaxially Grown Raised-Emitter SiGe HBTs

机译:外延生长的凸起发射器SiGe HBT的直流和低频噪声特性的尺寸效应

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DC and low-frequency-noise characteristics of epitaxially grown raised-emitter (ERE) SiGe HBTs were investigated Experimental results indicate unexpected emitter-size dependencies of both base current and low-frequency noise. An ERE SiGe HBT with a scaled emitter exhibits about 10 times smaller 1/f noise than a poly-Si emitter SiGe HBT.
机译:上外延生长的升高发射器(ORE)SiGe HBT的DC和低频噪声特性进行了研究实验结果表明基本电流和低频噪声的意外发射极尺寸依赖性。具有缩放发射极的ERE SiGe HBT展示了比Poly-Si发射器SiGe HBT更小的1 / F噪声的10倍。

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