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Residual sintering stress measurement method for glass-ceramic substrates

机译:玻璃陶瓷基材的残余烧结应力测量方法

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Micro-Vickers indentation is applied to the measurement of the residual sintering stresses produced in glass-ceramic substrates with multilayer copper circuit traces. In this method, the ceramic stress is obtained from the difference in cracklengths produced on the substrates by the micro-Vickers indentation in the stressed and without-stress conditions.At first, the relation between stress and crack length is obtained by applying the method to glass-ceramic plates with a known stress produced by 4-point bending. Next, we discuss the conditions under which we can apply this method for substrates withmultilayer copper circuits. If the measurement is conducted very near to a copper layer, the crack produced bends toward the copper. From finite-element thermal stress analyses, we found that this bending is not caused by the residual stress distributionbut rather by the indentation-produced bending deformation of substrate where it is softened by the presence of the copper. The regions to which our method is applicable are restricted to those with distances of more than 50μm from the copper to preventsuch crack bending.
机译:用多层铜电路迹线应用微维骑族压痕对玻璃 - 陶瓷基板中产生的残留烧结应力的测量。在该方法中,通过在应力和无应力条件下通过微维克斯凹陷在基板上产生的裂缝长度的易裂缝中获得陶瓷应力。首先,通过将方法应用于来实现应力和裂缝长度之间的关系玻璃陶瓷板,具有4点弯曲产生的已知应力。接下来,我们讨论了我们可以使用管道铜路电路的基板应用该方法的条件。如果测量非常靠近铜层,则裂缝产生弯曲朝向铜。从有限元热应力分析中,我们发现这种弯曲不是由残余应力分配而不是由基板的压痕产生的弯曲变形引起的,在那里它通过铜的存在而软化。我们的方法适用的区域仅限于铜的距离超过50μm的那些,以防止裂缝弯曲。

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