首页> 外文会议>International Conference on Electro-Optical and Infrared Systems: Technology and Applications >Low-light-level SWIR photodetectors based on the InGaAs material system
【24h】

Low-light-level SWIR photodetectors based on the InGaAs material system

机译:基于InGaAs材料系统的低光级SWIR光电探测器

获取原文

摘要

The short-wavelength infrared (SWIR) regime between 1 and 3 μm is of high interest especially for surveillance,reconnaissance, and remote sensing applications. The availability of high-power, yet eye-safe SWIR laser sources is animportant asset enabling scene illumination and implementation of advanced active imaging concepts like gated viewing(GV) or light detection and ranging (LIDAR). With atmospheric nightglow also a natural, but faint source for sceneillumination is available for passive low-light-level imaging in the SWIR region.The most commonly employed material system for realizing SWIR photodetectors is InGaAs with an indium content of53%. The spectral sensitivity of In0.53Ga0.47As with its cut-off wavelength of 1.7 μm covers a wide part of the nightglowspectrum as well the emission lines of available laser sources at typical telecom wavelengths around 1.55 μm. However,for low-light-level passive SWIR imaging a dark-current density around 10~(-9) A/cm~2 is considered mandatory. While theinternational state-of-the-art has already achieved this performance at room-temperature operation, today’s European stateof-the-art is still lagging behind.The development of InGaAs-based SWIR detectors at Fraunhofer IAF aims at pin as well as avalanche photodiodes (APDs)for imaging applications with 640×512 pixels. While InGaAs APDs play to their strength in GV applications with typicallyrather short integration times, planar processed InGaAs/InP pin photodiodes with lowest possible dark-current and noisecharacteristics are the detector devices of choice for passive low-light-level detection. Within a few planar-process batches,we approached the European state-of-the-art for the dark-current density of 15-μm-pitch InGaAs pin detectors by aremaining factor of five. The most recent process run yielded further slightly improved dark-current characteristics on testdevices. Recently, we have started with in-house characterization of such focal plane detector arrays hybridized withsuitable SWIR read-out integrated circuits.
机译:1至3μm之间的短波长红外(SWIR)制度尤其对监视有高兴趣,侦察和遥感应用。高功率的可用性,但目前安全的SWIR激光源是一个重要资产,使现场照明和实施等级的主动成像概念(如门控观察)(GV)或光检测和测距(LIDAR)。大气睡眠也是一种自然,但场景的微弱来源SWIR区域中的被动低灯级成像可用照明。用于实现SWIR光电探测器的最常用的材料系统是具有铟含量的IngaAs53%。其截止波长为1.7μm的In0.53ga0.47as的光谱灵敏度覆盖了梦魇的宽部分光谱同样在典型电信波长下的可用激光源的发射线左右约为1.55μm。然而,对于低光级被动SWIR成像,暗电流密度约为10〜(--9)A / cm〜2被认为是强制性的。虽然这一点国际最先进的已经在室温运行中实现了这种表现,今天的欧洲议定团 - 最艺术仍然落后。Fraunhofer IAF在Fraunhofer IAF的基于InGaAs的SWIR探测器的开发瞄准销以及雪崩光电二极管(APDS)用于具有640×512像素的成像应用。虽然Ingaas APD通常使用GV应用程序的优势相当短的集成时间,平面处理IngaAs / InP PIN光电二极管,具有最低可能的暗电流和噪声特性是被动低电平检测选择的检测器装置。在几个平面过程中批次,我们通过a接近欧洲最先进的暗电流密度为15-μm间距Ingaas引脚探测器剩余因子五。最近的过程运行进一步略微改善了测试的暗电流特性设备。最近,我们已经开始了与之杂交的焦平面探测器阵列的内部表征合适的SWIR读出集成电路。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号