Low-Distortion Signal Generation for Analog/Mixed-Signal Circuit Testing with Digital ATE

摘要

This paper proposes low-distortion sinusoidal/two-tone signal generation techniques for analog/mixed-signal IC testing with a digital Automatic Test Equipment (ATE) using only single digital output pin. They provide a rectangular waveform approximated to a single-tone or two-tone with specified harmonics suppression; we can specify multiple harmonics to suppress using digital control, and it is followed by an analog LPF for smoothing. The proposed method is simple for implementation with modest performance, compared to a wide dynamic range delta-sigma DAC. Its configuration, principle, simulation as well as experimental results at the laboratory level are presented. Also its application, combined with a high-speed DAC for analog circuit testing is described.