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Deposition of Boron Nitride Films by Filament-Assisted CVD Using Tris (Bimethylamino) Borane Precursor

机译:使用Tris(Bimethylamino)硼烷前体通过细丝辅助CVD沉积氮化硼膜

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Boron nitride films were deposited on silicon substrate by a hot filament assisted chemical vapor deposition (HFCVD) system. The tris(dimethylamino)borane(B[N(CH_3)_2]_3) was used as the single source precursor which has both the boron and nitrogen source, ammonia gas was used as the assisted gas to increase the nitrogen concentration in the films. The films deposited by different ratios of precursor to ammonia gas flow rate and filament temperatures were investigated. The boron-carbon-nitrogen (BCN) compound films were deposited under lower filament temperature. With increasing the ammonia gas flow rate, the carbon concentration in the films decreased. Fourier transform infrared spectroscopy (FT-IR) and transmission electron microscopy (TEM) image reveal that hexagonal boron nitride (hBN) films were deposited at the higher filament temperature of 2000°C. Moreover, the crystallization degree of the films became better with the filament temperature increased.
机译:通过热长丝辅助化学气相沉积(HFCVD)系统在硅衬底上沉积氮化硼膜。使用Tris(二甲基氨基)硼烷(B [n(CH_3)_2] _3)作为具有硼和氮源的单源前体,用作辅助气体以增加膜中的氮浓度。研究了通过不同前体的不同比例沉积到氨气流速和灯丝温度的薄膜。在较低的灯丝温度下沉积硼 - 碳 - 氮(BCN)复合膜。随着氨气流速的增加,薄膜中的碳浓度降低。傅里叶变换红外光谱(FT-IR)和透射电子显微镜(TEM)图像显示,六边形氮化硼(HBN)膜在2000℃的较高灯丝温度下沉积。此外,薄膜温度增加,薄膜的结晶度变得更好。

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