Comprehensive Model of Ultrasonic Scattering from Cubic Polycrystalline Media Consisting of Anisotropic Texture and Grain Elongation

摘要

Random grain noise is a common feature in time signals when interrogating ultrasonic waves into metallic samples approach and exceed frequencies of around 5 MHz. The grain noise present in the signal is typically viewed as a nuisance since the amplitude of a reflection from an internal defect needs to become greater than the background grain noise in order to be detected. However, the defect detection configuration can be optimized if the grain noise level can be predicted prior to defect inspections. This idea has motivated the development of theoretical grain noise or backscatter models, which become especially useful when looking for defects with dimensions on the order of microns.