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Gate voltage dependence of channel length modulation for InGaAs n-channel MOSFETs

机译:InGaAs N沟道MOSFET沟道长度调制栅极电压依赖性

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This paper describes gate voltage dependence of channel length modulation for InGaAs n-channel MOSFETs. The gate voltage dependence of the channel length modulation is extracted from experimental current voltage characteristics. It is found that InGaAs n-channel MOSFETs show the gate voltage dependence of channel length modulation. To investigate the effects of the VG dependence of λ on the current voltage characteristics, the analytical MOSFET model is compared with the experimental data. It is found that the VG dependence of λ is essential in simulation of the current voltage characteristics for InGaAs n-channel MOSFETs.
机译:本文介绍了IngaAs N沟道MOSFET的通道长度调制的栅极电压依赖性。沟道长度调制的栅极电压依赖性从实验电流电压特性提取。发现IngaAs N沟道MOSFET示出了通道长度调制的栅极电压依赖性。为了研究λ对电流电压特性对λ的VG依赖性的影响,将分析MOSFET模型与实验数据进行比较。结果发现,λ的Vg依赖性在模拟InGaAs N沟道MOSFET的电流电压特性方面是必要的。

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