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Gate voltage dependence of channel length modulation for InGaAs n-channel MOSFETs

机译:InGaAs n沟道MOSFET的沟道长度调制的栅极电压依赖性

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This paper describes gate voltage dependence of channel length modulation for InGaAs n-channel MOSFETs. The gate voltage dependence of the channel length modulation is extracted from experimental current voltage characteristics. It is found that InGaAs n-channel MOSFETs show the gate voltage dependence of channel length modulation. To investigate the effects of the VG dependence of λ on the current voltage characteristics, the analytical MOSFET model is compared with the experimental data. It is found that the VG dependence of λ is essential in simulation of the current voltage characteristics for InGaAs n-channel MOSFETs.
机译:本文介绍了InGaAs n沟道MOSFET的沟道长度调制的栅极电压依赖性。从实验电流电压特性中提取出沟道长度调制的栅极电压依赖性。发现InGaAs n沟道MOSFET显示出沟道长度调制的栅极电压依赖性。为了研究λ的VG依赖性对电流电压特性的影响,将MOSFET的解析模型与实验数据进行了比较。发现在模拟InGaAs n沟道MOSFET的当前电压特性时,λ的VG依赖性至关重要。

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