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Influence of the reaction temperature on Cd_(1-x)Zn_xS thin films with chemical bath deposited

机译:反应温度对CD_(1-X)Zn_XS薄膜用化学浴的影响

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Cd_(1-x)Zn_xS thin films were deposited on soda-lime glass substrates with chemical-bath deposition (CBD) using cadmium acetate, zinc sulfate, thiourea, ammonia and ammonium acetate aqueous solution at different with stirring. All the samples were annealed at 200°C for 60min in the air. The crystal structure, surface morphology, thickness and optical properties of Cd_(1-x)Zn_xS thin films with increasing ammonia concentration were studied with X-ray diffraction (XRD), scanning electron microscopy (SEM), step height measurement instrument and spectrophotometer respectively. The results revealed that Cd_(1-x)Zn_xS thin films had cubic crystal structure and the intensity of the diffraction peak decreased gradually as reaction temperature rose and the average crystal size was from 7.0 nm to 8.9 nm. All of Cd_(1-x)Zn_xS thin films had a granular surface with some smaller pores. The Cd_(1-x)Zn_xS thin films band gap was from 2.68 eV to 2.83 eV. The transmission of film deposited at 80°C was highest. The suitable reaction temperature was from 70°C to 80°C.
机译:使用叔醋酸镉,硫酸锌,硫酸盐,氨和乙酸铵水溶液在不同的搅拌下沉积CD_(1-X)Zn_XS薄膜沉积在钠钙玻璃基板上,用化学浴沉积(CBD)。将所有样品在200℃下退火60min。用X射线衍射(XRD),扫描电子显微镜(SEM),步进高度测量仪和分光光度计,研究了CD_(1-X)Zn_XS薄膜的CD_(1-X)Zn_XS薄膜的晶体结构,表面形貌,薄膜的薄膜。结果表明,CD_(1-X)Zn_XS薄膜具有立方晶体结构,随着反应温度升高,平均晶体尺寸为7.0nm至8.9nm,衍射峰的强度逐渐降低。所有CD_(1-x)Zn_XS薄膜具有颗粒表面,孔隙较小。 CD_(1-x)Zn_XS薄膜带隙为2.68eV至2.83eV。在80℃下沉积的薄膜的透射最高。合适的反应温度为70℃至80℃。

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