首页> 外文会议>IEEE Nuclear Science Symposium >A Novel 2D Position Sensitive Silicon Detector with Micron Resolution for Heavy Ion Tracking
【24h】

A Novel 2D Position Sensitive Silicon Detector with Micron Resolution for Heavy Ion Tracking

机译:具有微米分辨率的新型2D定位敏感硅探测器,用于重离子跟踪

获取原文

摘要

A new 2D position sensitive silicon detector for tracking of energetic heavy ions is under development in a program to study the radiation effect within a single human cell. The detector is based on a concept of interleaved pixel electrodes arranged in a projective 2D strip readout (stripixel). A fine position resolution in the sub-micron range can be achieved by determining the centroid of the charge collected on pixel electrodes with a granularity in the range of 10μm. Beam test results with 1GeV/n Fe ions have demonstrated an rms position resolution of about 0.5 micron with a 30μm pixel pitch.
机译:用于跟踪能量重离子的新的2D位置敏感硅检测器是在一个程序中研究了单个人细胞内的辐射效应的过程中。检测器基于布置在投影2D条读数(rimixel)中的交错像素电极的概念。通过确定在像素电极上收集的电荷的质心在10μm的范围内,可以通过确定在像素电极上收集的电荷的质心来实现亚微米范围中的精细位置分辨率。具有1Gev / n Fein离子的光束测试结果已经证明了RMS位置分辨率,约为0.5微米,其像素间距为30μm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号