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Effects of Acid Modified SiO_2 on Ionic Conductivity and Blend Properties of LiBF_4 Doped PMMA/ENR 50 Electrolytes

机译:酸改性SiO_2对Libf_4掺杂PMMA / REM 50电解质离子电导率和混合性能的影响

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Previously, it was found that the addition of SiO_2 filler can improve the homogeneity and enhance the ionic conductivity of lithium tetrafluoroborate (LiBF_4) doped polymethyl methacrylate/50% epoxidized natural rubber (PMMA/ENR 50) blend from 6.21 × 10~(-7) Scm~(-1) to 5.26 × 10~(-6) Scm~(-1). Unfortunately, this SiO_2 filler tend to agglomerates thus obstructing the smoothness in the transportation of lithium ion in the polymer blend matrix. This unruly phenomenon was due to the formation of hydrogen bonding between the oxygen atom of SiO_2 and the hydrogen atom from the moisture. Therefore, in this study, this SiO_2 filler was modified using hydrochloric acid (HCl) to reduce the formation of hydrogen bonding between SiO_2 and moisture. It was found that the modification was able to reduce the hydrogen bond in SiO_2 filler. The CHNS analysis shows that the percentage of hydrogen reduces as concentration of acid increased. This was further confirmed from the FT-IR analysis in which the peak corresponding to Si-OH was reduces meanwhile the peaks corresponding to Si-O-Si increases as HCl concentration increased. As a result, the homogeneity of the blends was further improved. However, the ionic conductivity of the system was found slightly reduce by few magnitudes. Temperature dependence ionic conductivity of LiBF_4 doped PMMA/ENR 50 filled HCl-SiO_2 electrolytes shows nonlinear trend indicates that the system not obeys Arrhenius equation.
机译:以前,发现加入SiO_2填料可以提高均匀性并增强四氟硼酸锂(LiBF_4)掺杂聚甲基丙烯酸甲酯/ 50%环氧化天然橡胶(PMMA / REM 50)共混物的离子电导率从6.21×10〜(-7 )SCM〜(-1)至5.26×10〜(-6)SCM〜(-1)。不幸的是,该SiO_2填料倾向于附聚,从而阻碍了聚合物共混基质中锂离子的平滑度。这种不守规矩的现象是由于SiO_2的氧原子与来自水分的氢原子之间的氢键合。因此,在该研究中,使用盐酸(HCl)改性该SiO_2填料,以减少SiO_2和水分之间的氢键的形成。发现修饰能够在SiO_2填料中减少氢键。 CHN分析表明,随着酸浓度的增加,氢气的百分比降低。从FT-IR分析中进一步证实了该FT-IR分析,其中对应于Si-OH的峰值随着HCl浓度增加而对应于Si-O-Si的峰值增加。结果,进一步改善了共混物的均匀性。然而,发现系统的离子电导率略微减少少量。 Libf_4掺杂PMMA / eN50填充HCL-SiO_2电解质的温度依赖性离子电导率显示非线性趋势,表明该系统不遵循Arhenius方程。

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