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Deposition of Undoped and Al doped ZnO Thin Films using RF Magnetron Sputtering and Study of their Structural, Optical and Electrical Properties

机译:使用RF磁控溅射沉积未掺杂的和掺杂的ZnO薄膜,并研究其结构,光学和电气性能

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Undoped ZnO and Al doped ZnO thin films were deposited on glass and p-Si(100) substrates by RF magnetron sputtering technique at room temperature using homemade targets. ZnO target containing 5 at% of Al_2O_3 as doping source was used for the growth of Al doped ZnO thin films. XRD revealed that the films have hexagonal wurtzite structure with high crystallinity. Morphology and chemical composition of the films have been indicated by FESEM and EDAX studies. A blue shift of the band gap energy and higher optical transmittance has been observed in the case of Al doped ZnO (ZnO:Al) thin films with respect to the ZnO thin films. The as deposited films on p-Si were used to fabricate n-ZnO/p-Si(100) and n-ZnO:Al/pSi(100) heteroj unction diodes and their room temperature current-voltage characteristics were studied.
机译:使用自制靶标在室温下通过RF磁控溅射技术沉积未掺杂的ZnO和Al掺杂的ZnO薄膜在玻璃和P-Si(100)基板上。含有5at%的Al_2O_3作为掺杂源的ZnO靶用于Al掺杂ZnO薄膜的生长。 XRD透露,薄膜具有六边形紫立岩结构,具有高结晶度。 FESEM和EDAX研究表明了薄膜的形态和化学成分。在相对于ZnO薄膜的Al掺杂ZnO(ZnO:Al)薄膜的情况下,已经观察到带隙能量和更高光学透射率的蓝色偏移。作为P-Si上的沉积薄膜用于制造N-ZnO / P-Si(100)和N-ZnO:Al / PSI(100)HeteroJ UnicoRJ Uperod Diodes及其室温电流 - 电压特性。

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