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Structural and Dielectric Properties of Gd doped Bismuth Ferrite-Lead Titanate

机译:GD掺杂铋铁素体 - 铅钛酸盐的结构和介电性能

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0.5BiGd_xFe_(1-x)O_3-0.5PbTiO_3 with x=0.05, 0.10, 0.15, 0.20 composite was prepared by mixed oxide method. Structural characterization was performed by X-ray diffraction and studied that the materials show tetragonal structure at room temperature for all concentration of Gd. Studies of dielectric properties (ε_r and tanδ) of the above compound at different frequencies in a wide range of temperature (25°-500°C) with an impedance analyser revealed that the dielectric constant increases with increase in Gd concentration as well temperature and the compound do not have any dielectric anomaly in the studied frequency and temperature range.
机译:0.5bigd_xfe_(1-x)O_3-0.5pbtio_3具有x = 0.05,0.10,0.15,0.20复合材料通过混合氧化物方法制备。通过X射线衍射进行结构表征,并研究了这些材料在室温下显示出四方结构,用于所有GD的全浓度。用阻抗分析仪在宽范围温度(25°-500℃)的不同频率下的上述化合物的介电性质(ε_R和tanδ)显示介电常数随着GD浓度的增加而增加,因此温度和温度化合物在研究的频率和温度范围内没有任何介电异常。

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