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Electron Accumulation/ Depletion at F_(16)CoPc/Znq_3 Heterojunction: Kelvin Probe and Charge Transport Study

机译:电子积累/耗尽在F_(16)COPC / ZNQ_3异质结:Kelvin探测和电荷运输研究

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We have synthesized n-n isotype organic heterojunction comprising of n-type cobalt hexadecafluorophthalocyanine (F_(16)CoPc)/n-type tris(8-hydroxyquinoline)zinc (Znq_3) thermal evaporation method. Using Kelvin probe we found that electrons are accumulated at F_(16)CoPc and depleted in Znq_3 sides of interface. The total thickness of electrons accumulation and depletion were found to be 16 nm. Electron accumulation was further confirmed by charge transport measurement.
机译:我们已经合成了N-N同种型有机异质结,其包含N型钴己二氟酞菁(F_(16)COPC)/ N型TRIS(8-羟基喹啉)锌(ZNQ_3)热蒸发方法。使用Kelvin探测器,我们发现电子在F_(16)COPC处积聚并在界面的ZnQ_3侧耗尽。发现电子积累和耗尽的总厚度为16nm。通过电荷传输测量进一步证实了电子积累。

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