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Structural and Optical Properties of Electrochemically Grown Highly Crystalline Cu_2ZnSnS_4 (CZTS) Thin Films

机译:电化学生长高度结晶Cu_2ZnSNS_4(CZTS)薄膜的结构和光学性质

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We have fabricated kesterite phase films of Cu_2ZnSnS_4 (CZTS) using a single bath electrodeposition process followed by sulfurisation. Morphological analysis using SEM shows that the films have densely packed micron size grains. XRD and Raman spectroscopy confirm that grown films are highly crystalline and kesterite in phase. Band gap of electrochemically deposited films is estimated to 1.51 eV by using UV-Vis absorption spectra. Photoluminescence measurements show a single emission peak at 1.5 eV which corresponds to band to band transition of CZTS film. The electrical conductivity measurements of the films show good ohmic behavior of the contacts and the average conductance value is 50 μS.
机译:我们使用单浴电沉积过程制造了Cu_2zNSNS_4(CZTS)的ketterite相膜,然后进行硫化。使用SEM的形态学分析表明,薄膜具有密集的微米尺寸晶粒。 XRD和拉曼光谱证实,生长的薄膜是高度结晶和ketertite的相位。通过使用UV-Vis吸收光谱估计电化学沉积膜的带隙为1.51eV。光致发光测量显示在1.5 EV的单个发射峰值,其对应于CZT膜的带转换带。薄膜的电导率测量显示触点的良好欧姆行为,平均电导值为50μs。

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