Analysis of Multiconductor Transmission Line's Sensitivity to Damage : Two Complementary Approaches

摘要

As electronic devices are more and more used in many different fields, monitoring the health and the ageing of complex wiring networks becomes a crucial need. Although experimental methods, such as Reflectometry can quite accurately localize hard defects (e.g.: open or short circuits), none is currently able to detect and study their evolution from their emergence (soft defects). This article proposes two complementary ways to answer this issue. The first one relies on analytical results whereas the other is based on simulations. Each one has its own benefits but using them in synergy could be an easy and promising way of assessing the ageing of cables.